金刚石对顶砧原位电导率测量系统

李明 杨洁 杨伍明 王会新 李立新 高春晓

李明, 杨洁, 杨伍明, 王会新, 李立新, 高春晓. 金刚石对顶砧原位电导率测量系统[J]. 高压物理学报, 2012, 26(1): 27-32. doi: 10.11858/gywlxb.2012.01.004
引用本文: 李明, 杨洁, 杨伍明, 王会新, 李立新, 高春晓. 金刚石对顶砧原位电导率测量系统[J]. 高压物理学报, 2012, 26(1): 27-32. doi: 10.11858/gywlxb.2012.01.004
LI Ming, YANG Jie, YANG Wu-Ming, WANG Hui-Xin, LI Li-Xin, GAO Chun-Xiao. An in Situ Electrical Conductivity Measurement System in Diamond Anvil Cell[J]. Chinese Journal of High Pressure Physics, 2012, 26(1): 27-32. doi: 10.11858/gywlxb.2012.01.004
Citation: LI Ming, YANG Jie, YANG Wu-Ming, WANG Hui-Xin, LI Li-Xin, GAO Chun-Xiao. An in Situ Electrical Conductivity Measurement System in Diamond Anvil Cell[J]. Chinese Journal of High Pressure Physics, 2012, 26(1): 27-32. doi: 10.11858/gywlxb.2012.01.004

金刚石对顶砧原位电导率测量系统

doi: 10.11858/gywlxb.2012.01.004
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    通讯作者:

    李明 E-mail:mli7901@yahoo.com.cn

An in Situ Electrical Conductivity Measurement System in Diamond Anvil Cell

  • 摘要: 在金刚石对顶砧中进行原位高温高压电阻测量时,由于受到绝热层的限制,从而达不到理想的温度条件。采用普通的粉末绝热材料,会给电极的引入造成很大困难,而且不规则的电阻丝使电阻测量很难精确量化。利用溅射镀膜方法,在对顶砧的砧面上镀氧化铝膜作绝热层,溅射的金属钼膜作电极材料,成功地完成了高温高压条件下原位电阻的测量。利用此装置,测量了铁镁硅酸盐(Mg0.875,Fe0.125)2SiO4在高温高压环境下(31~35 GPa,1 500~3 400 K)的电导率,得到了样品的导电粒子激活能,发现其激活能随着压强的升高而增大,与低压低温(小于15 GPa,低于1 200 K)条件相比,其激活体积和激活能都明显减小。

     

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出版历程
  • 收稿日期:  2010-07-07
  • 修回日期:  2011-01-06
  • 发布日期:  2012-02-15

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