Volume 28 Issue 3
Jun 2015
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FAN Da-Wei, XU Jin-Gui, WEI Shu-Yi, CHEN Zhi-Qiang, XIE Hong-Sen. In-Situ High-Pressure Synchrotron X-Ray Diffraction of Natural Epidote[J]. Chinese Journal of High Pressure Physics, 2014, 28(3): 257-261. doi: 10.11858/gywlxb.2014.03.001
Citation: FAN Da-Wei, XU Jin-Gui, WEI Shu-Yi, CHEN Zhi-Qiang, XIE Hong-Sen. In-Situ High-Pressure Synchrotron X-Ray Diffraction of Natural Epidote[J]. Chinese Journal of High Pressure Physics, 2014, 28(3): 257-261. doi: 10.11858/gywlxb.2014.03.001

In-Situ High-Pressure Synchrotron X-Ray Diffraction of Natural Epidote

doi: 10.11858/gywlxb.2014.03.001
  • Received Date: 28 Oct 2012
  • Rev Recd Date: 06 Jan 2013
  • In situ angle dispersive X-ray diffraction measurements for a natural epidote were performed with diamond anvil cell instrument and synchrotron radiation at NSLS (National Synchrotron Light Source).The maximal pressure in the experiment was 9.16 GPa.At experimental pressures, no evidence of phase transition of the epidote was observed.A fit to the third-order Birch-Murnaghan equation of state yielded an isothermal bulk modulus of 116(7) GPa and its pressure derivative of 7.8(8).The isothermal bulk modulus of epidote is determined to be 132(4) GPa, assuming that its first pressure derivative is 4.Furthermore, we confirm that the linear compressibilities along a, b, and c directions of epidote are elastically anisotropic.Consequently, it can be concluded that the compressibility of epidote under high pressures has been accurately constrained.

     

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