Volume 27 Issue 6
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FAN Da-Wei, WEI Shu-Yi, LIU Jing, XIE Hong-Sen. X-Ray Diffraction Investigation of Chalcopyrite under High Pressure and Temperature[J]. Chinese Journal of High Pressure Physics, 2013, 27(6): 828-832. doi: 10.11858/gywlxb.2013.06.006
Citation: FAN Da-Wei, WEI Shu-Yi, LIU Jing, XIE Hong-Sen. X-Ray Diffraction Investigation of Chalcopyrite under High Pressure and Temperature[J]. Chinese Journal of High Pressure Physics, 2013, 27(6): 828-832. doi: 10.11858/gywlxb.2013.06.006

X-Ray Diffraction Investigation of Chalcopyrite under High Pressure and Temperature

doi: 10.11858/gywlxb.2013.06.006
  • Received Date: 17 Mar 2012
  • Rev Recd Date: 03 May 2012
  • Publish Date: 15 Dec 2013
  • In situ angle dispersive X-ray diffraction measurements for a natural chalcopyrite were performed by using heating diamond anvil cell instrument with synchrotron radiation at BSRF up to 32.0 GPa and 628 K. The phase transition of chalcopyrite from chalcopyrite structure to rocksalt structure is around 6.0 GPa. A fit to the high temperature third-order Birch-Murnaghan equation of state yielded an isothermal bulk modulus K0=109(3) GPa, a temperature derivative of the bulk modulus (dK/dT)p=-0.033(4) GPaK-1, and a thermal expansion coefficient 0=2.0(2)10-5 K-1 of rocksalt structure phase of chalcopyrite for the first time.

     

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