Volume 25 Issue 2
Apr 2015
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GUI Yu-Lin, SUN Cheng-Wei, ZHANG Guang-Sheng, LI Qiang. Void Growth and Local Temperature Rise in Necking Region of OFHC Ring[J]. Chinese Journal of High Pressure Physics, 2011, 25(2): 183-187 . doi: 10.11858/gywlxb.2011.02.016
Citation: GUI Yu-Lin, SUN Cheng-Wei, ZHANG Guang-Sheng, LI Qiang. Void Growth and Local Temperature Rise in Necking Region of OFHC Ring[J]. Chinese Journal of High Pressure Physics, 2011, 25(2): 183-187 . doi: 10.11858/gywlxb.2011.02.016

Void Growth and Local Temperature Rise in Necking Region of OFHC Ring

doi: 10.11858/gywlxb.2011.02.016
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  • Corresponding author: GUI Yu-Lin
  • Received Date: 30 Sep 2009
  • Rev Recd Date: 26 Oct 2009
  • Publish Date: 15 Apr 2011
  • The fragmentation tests of high-conductivity oxygen-free copper (M-state TU1) rings have been carried out by the electromagnetically driven expanding ring technique. Using a metallographic microscope, the void growth and coalescence were observed in the necking region of recovery fragment. The void growth conditions in the thin ring were analyzed with a spherical void model. The results showed that the circumferential deviatoric stress is more suitable for describing the void growth in necking zone of the expanding ring. Moreover, the local temperature rise effect of necking region was also discussed. This work may be helpful for the further meso-mechanics studies on necking instability of expanding metal ring.

     

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