Volume 24 Issue 4
Apr 2015
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SHEN Long-Hai, CUI Qi-Liang, LI Xue-Fei. Synchrotron Radiation X-Ray Diffraction Study of AlN Nanowires under High Pressures[J]. Chinese Journal of High Pressure Physics, 2010, 24(4): 267-270 . doi: 10.11858/gywlxb.2010.04.005
Citation: SHEN Long-Hai, CUI Qi-Liang, LI Xue-Fei. Synchrotron Radiation X-Ray Diffraction Study of AlN Nanowires under High Pressures[J]. Chinese Journal of High Pressure Physics, 2010, 24(4): 267-270 . doi: 10.11858/gywlxb.2010.04.005

Synchrotron Radiation X-Ray Diffraction Study of AlN Nanowires under High Pressures

doi: 10.11858/gywlxb.2010.04.005
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  • Corresponding author: CUI Qi-Liang
  • Received Date: 22 Jul 2009
  • Rev Recd Date: 30 Sep 2009
  • Publish Date: 15 Aug 2010
  • The high-pressure behavior of wurtzite AlN nanowires is studied up to 51.1 GPa by in situ angle dispersive X-ray diffraction using synchrotron radiation source and a diamond anvil cell. With increasing pressure up to 24.9 GPa, the wurtzite-to-rocksalt phase transition was observed. The rocksalt phase is quenched after a complete pressure release. The axial ratio c/a of the wurtzite AlN nanowires decreases linearly with increasing pressure. The unique wire-like structure in AlN nanowires results in the high pressure behavior being different from that of the bulk and nanocrystal AlN.

     

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