Citation: | SHEN Long-Hai, CUI Qi-Liang, LI Xue-Fei. Synchrotron Radiation X-Ray Diffraction Study of AlN Nanowires under High Pressures[J]. Chinese Journal of High Pressure Physics, 2010, 24(4): 267-270 . doi: 10.11858/gywlxb.2010.04.005 |
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