Volume 23 Issue 4
Apr 2015
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TIAN Bin, XU Bin, QI Yong-Xin, LI Mu-Sen, LI Li. Fine Structure of Fe-Based Metal Film Interface and Diamond Single Crystal Growth[J]. Chinese Journal of High Pressure Physics, 2009, 23(4): 247-251 . doi: 10.11858/gywlxb.2009.04.002
Citation: TIAN Bin, XU Bin, QI Yong-Xin, LI Mu-Sen, LI Li. Fine Structure of Fe-Based Metal Film Interface and Diamond Single Crystal Growth[J]. Chinese Journal of High Pressure Physics, 2009, 23(4): 247-251 . doi: 10.11858/gywlxb.2009.04.002

Fine Structure of Fe-Based Metal Film Interface and Diamond Single Crystal Growth

doi: 10.11858/gywlxb.2009.04.002
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  • Corresponding author: XU Bin
  • Received Date: 01 Aug 2008
  • Rev Recd Date: 14 Nov 2008
  • Publish Date: 15 Aug 2009
  • Field emission scanning electron microscope (FESEM) has been used to investigate the fine structure of Fe-based metal film interface and its crosssection. It is shown that nanoscale pyramid cone shapes are found on the metal film interface (100), serrate steps are found on the metal film interface (111), and cystiform shapes with terrace structure are found on the cross-section near the catalyst. Other faults have brittleness fracture characteristic with nanoscale clusters are found on the fault surface. It is proposed that the different morphologies of the metal film have relations with catalyzing mechanism. The brittleness fracture characteristic of the cross-sectionon might be due to the carbide existence, and the nanoscale particles should be eutectic carbides.

     

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