Volume 23 Issue 1
Apr 2015
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LI Xue-Fei, ZHANG Jian, LIU Wei, MA Hong-An, CUI Qi-Liang, ZOU Guang-Tian. Synchrotron Radiation X-Ray Diffraction of Carbon Nitride under High Pressure[J]. Chinese Journal of High Pressure Physics, 2009, 23(1): 71-74 . doi: 10.11858/gywlxb.2009.01.012
Citation: LI Xue-Fei, ZHANG Jian, LIU Wei, MA Hong-An, CUI Qi-Liang, ZOU Guang-Tian. Synchrotron Radiation X-Ray Diffraction of Carbon Nitride under High Pressure[J]. Chinese Journal of High Pressure Physics, 2009, 23(1): 71-74 . doi: 10.11858/gywlxb.2009.01.012

Synchrotron Radiation X-Ray Diffraction of Carbon Nitride under High Pressure

doi: 10.11858/gywlxb.2009.01.012
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  • Corresponding author: ZHANG Jian
  • Received Date: 15 Apr 2008
  • Rev Recd Date: 15 Jan 2009
  • Publish Date: 15 Feb 2009
  • In situ synchrotron radiation X-ray diffaction studies under high pressures and room temperature on the CN samples produced under 1 200 ℃ and 6.0 GPa have been carried out via the diamond anvil cell (DAC) technique. The results show that at room temperature and up to 44 GPa, both graphitic C3N4 and the unidentified orthogonal CN phase are stable.p-V data of both the two materials have been fitted to Murnaghan equation of state by using the least square method.

     

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