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JIANG De-Chun, ZENG Fan-Qun, TAN Duo-Wang, YANG Bin. Explosive Logic Element-Asynchronous and Logic Gate[J]. Chinese Journal of High Pressure Physics, 1997, 11(4): 270-275 . doi: 10.11858/gywlxb.1997.04.007
Citation: JIANG De-Chun, ZENG Fan-Qun, TAN Duo-Wang, YANG Bin. Explosive Logic Element-Asynchronous and Logic Gate[J]. Chinese Journal of High Pressure Physics, 1997, 11(4): 270-275 . doi: 10.11858/gywlxb.1997.04.007

Explosive Logic Element-Asynchronous and Logic Gate

doi: 10.11858/gywlxb.1997.04.007
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  • Corresponding author: JIANG De-Chun
  • Received Date: 14 Mar 1997
  • Rev Recd Date: 06 May 1997
  • Publish Date: 05 Dec 1997
  • With four explosive NULL gate, an asynchronous explosive AND gate is designed. Compared with synchronous explosive AND gate, it requires no synchrony and time sequencing to its two inputs, thus extends its application area and improves its reliability of normal function. Probability window of safty/reliability for the parameters of the explosive NULL gate is given and the time sequencing relationship of the asynchronous AND gate is also discussed.

     

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