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Chinese Journal of High Pressure Physics  > 1992  >  6(1): 48-53 .
ZHAO Yong-Nian, ZHANG Zhi-Lin, CUI Qi-Liang, LIU Zhen-Xian, ZOU Guang-Tian. The Compression Behavior of Raman Active Mode E2g of Graphite and the Pressure Effect of Force Constant of CC Bonding[J]. Chinese Journal of High Pressure Physics, 1992, 6(1): 48-53 . doi: 10.11858/gywlxb.1992.01.007
Citation: ZHAO Yong-Nian, ZHANG Zhi-Lin, CUI Qi-Liang, LIU Zhen-Xian, ZOU Guang-Tian. The Compression Behavior of Raman Active Mode E2g of Graphite and the Pressure Effect of Force Constant of CC Bonding[J]. Chinese Journal of High Pressure Physics, 1992, 6(1): 48-53 . doi: 10.11858/gywlxb.1992.01.007
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The Compression Behavior of Raman Active Mode E2g of Graphite and the Pressure Effect of Force Constant of CC Bonding

doi: 10.11858/gywlxb.1992.01.007

  • Institute of Atomic and Molecular Physics, Jilin University, Changchun 130023, China

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  • Corresponding author: ZHAO Yong-Nian
  • Received Date: 20 Sep 1991
  • Rev Recd Date: 20 Sep 1991
  • Publish Date: 05 Mar 1992
    Abstract
  • The frequency changes of Raman active mode E2g of graphite were measured with pressure in the range of 0 to 13 GPa. The results show that a discontinuity in d/dp appeared near 4 GPa and that d/dp is larger before the discontinuous point than behind it. This may be caused by the distortion of the hexagonal network of graphite near 4 GPa. In this paper, we also obtained a relation about the force constant of CC bonding of graphite under high pressure and revised E. Fitzer's equation on calculating the length of CC bonding with Raman frequency at ambient pressure.

     

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