In Situ Measurement of the Cupping Deformation of Diamond Anvil under High Pressures
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摘要: 基于白光频域干涉的基本原理，提出了一种可实现高压下金刚石压砧杯型形变原位测量的方法。简单介绍了利用频域干涉技术测量金刚石压砧在高压下的杯型形变的基本原理，并开展了实验研究，实验最高压力达到42.1GPa。实验结果显示，金刚石压砧的杯型形变与压力呈线性关系，最大值达到11.1μm，从实验上证实了最近的有限元数值模拟结果。Abstract: In this research we presented a novel method based on frequency domain interferometry to in situ measure the cupping deformation of diamond anvils under high pressures.First we introduced the working principle of the cupping deformation measurements based on the frequency domain interferometry, and then we carried out the experiments under high pressures.The cupping deformation of diamond anvils is obtained under high pressures up to 42.1GPa, and its maximum value reaches 11.1μm.The experimental results show that the cupping deformation increases linearly with the pressure.Our work verify the recent finite element modeling calculations.
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Key words:
- high pressure /
- frequency domain interferometry /
- diamond anvil /
- cupping deformation
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图 1 金刚石压砧杯型形变原位测量示意
((a)实验光路; (b)参考光和信号光来源示意)
Figure 1. Schematics of in situ measuring the cupping deformation of diamond anvil
((a)Experimental light path; (b)Origins of reference and signal beams)
图 2 典型频域干涉信号(42.1GPa)
Figure 2. Typical frequency domain interferometry signals at 42.1GPa
图 3 中心与边缘区域对应信号的傅里叶变换频谱
Figure 3. FFT spectra of signals at the center and edge of the anvil
图 4 金刚石压砧在高压下的形变分布
Figure 4. Deformation profiles of diamond anvil along the radial direction under high pressures
图 5 金刚石压砧在不同压力下的杯型形变
Figure 5. Cupping deformation of diamond anvils under high pressures
表 1 线性拟合结果
Table 1. Linear fitting results
Fitting data Intercept/
μmStandard error ofintercept Slope/
(μm·GPa-1)Standard error ofslope R2 FEM calculation 0.1268 0.1058 0.2404 0.0039 0.9961 Experimental data 0.4766 0.3846 0.2350 0.0136 0.9772 
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