The Compression Behavior of Raman Active Mode E2g of Graphite and the Pressure Effect of Force Constant of CC Bonding
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摘要: 本文在0~13 GPa压力范围内测量了石墨Raman活性模E2g的频率随压力的变化,结果表明在4 GPa附近d/dp出现了不连续点,该点前的d/dp大于该点后的d/dp,这是由于在压力的作用下石墨六角网格发生畸变所致。本工作还导出了高压状态下CC键力常数的表达式,对E. Fitzer在常压下用Raman频率计算CC键长的计算公式进行了修正。Abstract: The frequency changes of Raman active mode E2g of graphite were measured with pressure in the range of 0 to 13 GPa. The results show that a discontinuity in d/dp appeared near 4 GPa and that d/dp is larger before the discontinuous point than behind it. This may be caused by the distortion of the hexagonal network of graphite near 4 GPa. In this paper, we also obtained a relation about the force constant of CC bonding of graphite under high pressure and revised E. Fitzer's equation on calculating the length of CC bonding with Raman frequency at ambient pressure.
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Key words:
- graphite /
- Raman spectrum /
- pressure effect /
- force constant
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