[1] Rapoport E. Ann Chim Fr, 1985, 10: 607.
[2] DeVries R C, Fleischer J F. J Cryst drowth, 1972, 13-14: 88.
[3] Yamaoka S, Shimomura O, Akaishi M, et al. Physica B, 1986, 139-140: 668.
[4] Endo T, Fukunaga O, lwata M. J Mater Sci, 1981, 16: 2227.
[5] Endo T, Fukunaga O, lwata M. US Patent 4 287 164. 1981.
[6] Sato T, Endo T, Kashima S, et al. J Mater Sci, 1963, 18: 3054.
[7] Mishima O, Yamaoka S, Fukunaga O. J Appl Phys, 1987, 61: 2822.
[8] Hirano S I, Yamaguchi T, Naka S. J Am Ceram Soc, 1981, 64: 734.
[9] Lorenz H, Bendelyani N A, Gladskaya I S, et al. Proc. 18th European High Pressure Group Meet on High Pressure Research, 1990, High Pressure Res, 1991, 18: 198.
[10] Biardeau G, Demazeau G, Pouchard M. US Patent 4 810 479. 1989.
[11] Kabayama T. US Patent 3 959 443. 1976.
[12] Showa Denko. JP 59 199 514. 1984.
[13] Mazurenko A M, Leusenko A A, Shimanovich P P, et al. Svehtverd Mater, 1984, 5: 12.
[14] Llogd E C. Accurate Characterization of the High Pressure Enviroment. NBS-SP-326. 1971: 343.
[15] 周艳平, 阎学伟, 马贤锋, 等. 高压物理学报, 1995, 9(3): 176.
[16] DeVries R C. Technical Imformation Series. 72-CRD-178. New York: Res and Develop Center, G E, 1972.