[1] |
Rapoport E. Ann Chim Fr, 1985, 10: 607. |
[2] |
DeVries R C, Fleischer J F. J Cryst drowth, 1972, 13-14: 88. |
[3] |
Yamaoka S, Shimomura O, Akaishi M, et al. Physica B, 1986, 139-140: 668. |
[4] |
Endo T, Fukunaga O, lwata M. J Mater Sci, 1981, 16: 2227. |
[5] |
Endo T, Fukunaga O, lwata M. US Patent 4 287 164. 1981. |
[6] |
Sato T, Endo T, Kashima S, et al. J Mater Sci, 1963, 18: 3054. |
[7] |
Mishima O, Yamaoka S, Fukunaga O. J Appl Phys, 1987, 61: 2822. |
[8] |
Hirano S I, Yamaguchi T, Naka S. J Am Ceram Soc, 1981, 64: 734. |
[9] |
Lorenz H, Bendelyani N A, Gladskaya I S, et al. Proc. 18th European High Pressure Group Meet on High Pressure Research, 1990, High Pressure Res, 1991, 18: 198. |
[10] |
Biardeau G, Demazeau G, Pouchard M. US Patent 4 810 479. 1989. |
[11] |
Kabayama T. US Patent 3 959 443. 1976. |
[12] |
Showa Denko. JP 59 199 514. 1984. |
[13] |
Mazurenko A M, Leusenko A A, Shimanovich P P, et al. Svehtverd Mater, 1984, 5: 12. |
[14] |
Llogd E C. Accurate Characterization of the High Pressure Enviroment. NBS-SP-326. 1971: 343. |
[15] |
周艳平, 阎学伟, 马贤锋, 等. 高压物理学报, 1995, 9(3): 176. |
[16] |
DeVries R C. Technical Imformation Series. 72-CRD-178. New York: Res and Develop Center, G E, 1972. |